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Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)

Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
By Nicola Nicolici, Bashir M. Al-Hashimi

Publisher: Springer
Number Of Pages: 180
Publication Date: 2003-02-28
ISBN-10 / ASIN: 140207235X
ISBN-13 / EAN: 9781402072352
Binding:…

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